CPM-058

Unit : mm

CPM-058BF-3.1L

Unit : mm

CPM-058BF-3.38L

Unit : mm

CPM-058BF-4.9L

Unit : mm

CPM-058BF-5.8L

1. CPM-058BF-3.1L The CPM-058BF-3.1L semiconductor test probe is a high-performance tool designed for precise testing in the semiconductor industry. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 52 grams at 0.5mm, this probe ensures strong and reliable contact. It offers a full travel of 0.6mm, with a recommended travel of 0.5mm, making it suitable for precise measurements. With a mechanical life of 200K cycles, it guarantees durability and longevity. The probe exhibits a bandwidth of -0.082dB at 20GHz, ensuring accurate signal transmission. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

2. CPM-058BF-3.38L The CPM-058BF-3.38L semiconductor test probe is a reliable tool designed for demanding testing applications. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a SUS/Music Wire gold-plated spring. With a spring force of 30 grams at 0.5mm, it provides consistent contact for accurate measurements. The probe offers a full travel of 0.7mm, with a recommended travel of 0.5mm, ensuring precise testing capabilities. With an extended mechanical life of 500K cycles, it guarantees longevity and reliability. The probe exhibits a bandwidth of -0.381dB at 20GHz, suitable for high-frequency testing. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

3. CPM-058BF-4.9L The CPM-058BF-4.9L semiconductor test probe is a versatile tool designed for efficient testing in the semiconductor industry. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 30 grams at 0.65mm, it ensures reliable and accurate contact. The probe offers a full travel of 0.8mm, with a recommended travel of 0.65mm, providing flexibility in testing setups. With an extended mechanical life of 500K cycles, it offers long-lasting performance. The probe exhibits a bandwidth of -0.118dB at 20GHz, suitable for high-frequency applications. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

4. CPM-058BF-5.8L The CPM-058BF-5.8L semiconductor test probe is an excellent choice for precise testing requirements. It features BeCu/Sk4 gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 28 grams at 0.65mm, it ensures reliable and accurate contact for testing purposes. The probe offers a full travel of 1.0mm, with a recommended travel of 0.65mm, providing flexibility in testing setups. With an extended mechanical life of 500K cycles, it guarantees durability and longevity. The probe exhibits a bandwidth of -0.299dB at 20GHz, making it suitable for high-frequency testing. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

Unit : mm

CPM-058BF-6.3L

Unit : mm

CPM-058BF-8.65L

Unit : mm

CPM-058BF-8.85L

Unit : mm

CPM-058FF-11.3L