CPM-085
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Unit : mm
| Materials and finishes | ||
| Plunger-Top | BeCu / Au Plated | |
| Plunger-Bottom | BeCu / Au Plated | |
| Barrel | P.B. / Au Plated | |
| Spring | Music Wire / Au Plated | |
| Mechanical | ||
| Spring Force | 22grams @0.65mm | |
| Full Travel | 1.1mm | |
| Recommend Travel | 0.65mm | |
| Mechanical Life | 500K | |
| Bandwidth | -0.264dB@20GHz | |
| Electrical | ||
| Current Rating | 2A | |
| Contact Resistance | <100mΩ | |
Materials and Finishes: The Semiconductor Test Probe is meticulously crafted using top-of-the-line materials. Its plungers, both top and bottom, are made of BeCu (Beryllium Copper) and coated with a high-quality Au (gold) plating. The barrel, composed of P.B. (Phosphor Bronze), is also coated with Au for enhanced conductivity and durability. The spring, constructed from Music Wire, ensures optimal electrical performance and is also plated with Au for added corrosion resistance.
Mechanical Precision: With a spring force of 22 grams at 0.65mm, this probe guarantees precise contact and reliable testing results. It offers a full travel distance of 1.1mm, allowing for versatile testing requirements. The recommended travel distance of 0.65mm ensures optimal performance in various testing scenarios. With a mechanical life of 500K cycles, this probe is built to withstand the demanding conditions of semiconductor testing, ensuring longevity and consistency.
Impressive Bandwidth and Electrical Specifications: The Semiconductor Test Probe excels in its electrical performance. It boasts a remarkable bandwidth of -0.264dB at 20GHz, making it suitable for high-frequency applications. With a current rating of 2A, it can handle substantial power requirements, providing efficient and reliable testing capabilities. The contact resistance remains below 100mΩ, minimizing signal loss and ensuring accurate measurements.