cpm-080

Unit : mm

CPM-080BD-11.8L

Unit : mm

CPM-080BD-12.4L

Unit : mm

CPM-080BD-13.6L

CPM-080BD-11.8L Probe: Constructed with high-quality materials, this probe features a BeCu/Au-plated top plunger, a BeCu/Au-plated bottom plunger, a brass/Au-plated barrel, and a stainless steel/Au-plated spring. These meticulously chosen materials ensure optimal conductivity, durability, and corrosion resistance.

Mechanical Excellence: With a spring force of 50 grams at 1.8mm, this probe provides the perfect balance of pressure for reliable contact during testing. Its full travel distance of 2.5mm offers ample room for accommodating various test setups, while the recommended travel of 1.8mm ensures precise measurements. With a mechanical life of 500K cycles, this probe is built to withstand long-term usage without compromising its mechanical integrity.

Impressive Bandwidth and Electrical Specifications: The CPM-080BD-11.8L probe boasts an impressive bandwidth of -0.593dB at 20GHz, making it ideal for high-frequency applications. It features a current rating of 1A and exhibits contact resistance below 100mΩ, ensuring efficient power delivery and minimizing signal loss during testing.

Continuing with Excellence: CPM-080BD-12.4L and CPM-080BD-13.6L Probes: With similar materials, finishes, and mechanical features, the CPM-080BD-12.4L and CPM-080BD-13.6L probes further expand the capabilities of the series. The spring force of 50 grams at 1.8mm, full travel of 2.5mm, and recommended travel of 1.8mm make these probes versatile and reliable in a wide range of semiconductor testing applications.

Moreover, the CPM-080BD-13.6L probe showcases an enhanced spring force of 60 grams at 1.8mm and a full travel distance of 2.8mm, offering increased precision and adaptability. Both probes share the same mechanical life of 500K cycles, exceptional bandwidth, current rating, and contact resistance.

The CPM-080BD series probes, with their exceptional materials, precise mechanical features, and outstanding electrical performance, are the epitome of excellence in semiconductor testing. Whether used in research and development, quality assurance, or production testing, these probes empower semiconductor professionals to achieve optimal results and ensure the reliability and performance of their devices. Trust in the CPM-080BD series probes to elevate your semiconductor testing capabilities to new heights.