cpm-110

Unit : mm

CPM-110B1B1-25.5L

Unit : mm

CPM-110DF-6.2L

Materials and Finishes:
The CPM-110B1B1-25.5L test probe is built with high-quality materials to ensure optimal functionality. The plunger-top and plunger-bottom are made of BeCu (Beryllium Copper) and coated with a premium Au (gold) plating. The barrel is composed of P.B. (Phosphor Bronze) with an Au plating, while the spring is constructed from Music Wire, also featuring an Au plating. These materials and finishes enhance conductivity and durability, ensuring reliable performance.

Mechanical Precision:
This test probe excels in mechanical precision, making it suitable for a wide range of semiconductor testing applications. With a spring force of 45 grams at 2.2mm, it provides a strong and stable contact. The full travel distance of 3.6mm allows for versatile testing needs, while the recommended travel distance of 2.2mm ensures optimal performance. With a mechanical life of 500K cycles, this probe is built to withstand prolonged use and maintain consistent results.

Impressive Bandwidth and Electrical Specifications:
The CPM-110B1B1-25.5L test probe offers exceptional electrical performance. It achieves a remarkable bandwidth of -0.387dB at 20GHz, enabling precise and accurate signal transmission even at high frequencies. With a current rating of 2A, it can handle demanding power requirements, making it suitable for a variety of semiconductor devices. The contact resistance remains below 100mΩ, minimizing signal loss and ensuring reliable measurements.

Model: CPM-110DF-6.2L

Materials and Finishes:
The CPM-110DF-6.2L test probe also features high-quality materials and finishes. The plunger-top and plunger-bottom are made of BeCu and coated with Au plating, ensuring excellent electrical properties and durability. The barrel is crafted from Phosphor Bronze with an Au plating, while the spring is made of SWPB (Square Wire Phosphor Bronze) and also features an Au plating. These materials provide optimal conductivity and robustness.

Mechanical Precision:
With a spring force of 40 grams at 0.6mm, the CPM-110DF-6.2L test probe offers precise and reliable contact. The full travel distance of 1.6mm provides flexibility for various testing requirements, while the recommended travel distance of 0.6mm guarantees accurate results. Its mechanical life of 500K cycles ensures longevity and consistent performance, even in demanding testing environments.

Impressive Bandwidth and Electrical Specifications:
The CPM-110DF-6.2L test probe delivers excellent electrical performance. It achieves a bandwidth of -0.25dB at 20GHz, enabling precise signal transmission and accurate measurements. With a current rating of 2A and contact resistance below 100mΩ, it ensures efficient power handling and minimal signal loss.

In conclusion, the CPM-110 Series Test Probes provide exceptional performance and reliability for semiconductor testing. With their high-quality materials, precise mechanical features, and impressive electrical specifications, these probes offer accurate and consistent results. Whether you are testing integrated circuits, transistors, or other semiconductor components, you can rely on the CPM-110 Series to deliver precise measurements and contribute to the quality assurance of your electronic devices.