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Unit : mm
CPM-GX031FF-3.13L
Materials and finishes | ||
Plunger-Top | Pd Alloy | |
Plunger-Bottom | BeCu / Au Plated | |
Barrel | P.B. / Au Plated | |
Spring | Satinless Steel / Au Plated |
Mechanical | ||
Spring Force | 30grams @0.35mm | |
Full Travel | 0.45mm | |
Recommend Travel | 0.35mm | |
Mechanical Life | 250K | |
Bandwidth | -0.44dB@20GHz |
Electrical | ||
Current Rating | 2A | |
Contact Resistance | <100mΩ | |
Self Inductance | 1.3nH | |
Capacitance | 1.25pF |
Unit : mm
CPM-GX031FD-3.3L
Materials and finishes | ||
Plunger-Top | Pd Alloy | |
Plunger-Bottom | BeCu / Au Plated | |
Barrel | P.B. / Au Plated | |
Spring | Satinless Steel / Au Plated |
Mechanical | ||
Spring Force | 36grams @0.35mm | |
Full Travel | 0.5mm | |
Recommend Travel | 0.35mm | |
Mechanical Life | 250K | |
Bandwidth | -0.57dB@20GHz |
Electrical | ||
Current Rating | 2A | |
Contact Resistance | <100mΩ |
Unit : mm
CPM-GX038FR-2.87L
Materials and finishes | ||
Plunger-Top | BeCu / Au Plated | |
Plunger-Bottom | BeCu / Au Plated | |
Barrel | P.B. / Au Plated | |
Spring | Music Wire / Au Plated |
Mechanical | ||
Spring Force | 16grams @0.4mm | |
Full Travel | 0.6mm | |
Recommend Travel | 0.4mm | |
Mechanical Life | 200K | |
Bandwidth | -0.217dB@20GHz |
Electrical | ||
Current Rating | 2A | |
Contact Resistance | <100mΩ |
Unit : mm
CPM-GX058FB-10.8L
Materials and finishes | ||
Plunger-Top | BeCu / Au Plated | |
Plunger-Bottom | BeCu / Au Plated | |
Barrel | P.B. / Au Plated | |
Spring | Music Wire / Au Plated |
Mechanical | ||
Spring Force | 30grams @0.9mm | |
Full Travel | 1.5mm | |
Recommend Travel | 0.9mm | |
Mechanical Life | 200K | |
Bandwidth | -0.154dB@20GHz |
Electrical | ||
Current Rating | 2A | |
Contact Resistance | <100mΩ |
Materials and Finishes: The CPM-GX031FF-3.13L test probe features a Plunger-Top made of Pd (Palladium) Alloy, providing excellent electrical properties. The Plunger-Bottom is constructed with BeCu (Beryllium Copper) and coated with a premium Au (gold) plating. The Barrel is composed of P.B. (Phosphor Bronze) with an Au plating, while the Spring is made of stainless steel and also features an Au plating. These materials and finishes ensure optimal conductivity, durability, and performance.
Mechanical Precision: With a spring force of 30 grams at 0.35mm, the CPM-GX031FF-3.13L test probe offers precise and stable contact. The full travel distance of 0.45mm allows for accurate measurements, while the recommended travel distance of 0.35mm ensures optimal performance. Its mechanical life of 250K cycles guarantees reliability and longevity.
Impressive Bandwidth and Electrical Specifications: The CPM-GX031FF-3.13L test probe excels in electrical performance, achieving a bandwidth of -0.44dB at 20GHz. This enables high-frequency signal transmission and accurate measurements. With a current rating of 2A and contact resistance below 100mΩ, it ensures efficient power handling and minimal signal loss. The probe also exhibits a self inductance of 1.3nH and a capacitance of 1.25pF, further enhancing its electrical capabilities.
Model: CPM-GX031FD-3.3L
Materials and Finishes: Similar to the previous model, the CPM-GX031FD-3.3L test probe features a Plunger-Top made of Pd Alloy for optimal electrical properties. The Plunger-Bottom is constructed with BeCu and coated with Au plating. The Barrel is composed of P.B. with an Au plating, while the Spring is made of stainless steel and features an Au plating. These materials ensure excellent conductivity and durability.
Mechanical Precision: With a spring force of 36 grams at 0.35mm, the CPM-GX031FD-3.3L test probe provides reliable and stable contact during semiconductor testing. The full travel distance of 0.5mm and the recommended travel distance of 0.35mm allow for precise measurements. Its mechanical life of 250K cycles ensures long-term reliability and consistent performance.
Impressive Bandwidth and Electrical Specifications: The CPM-GX031FD-3.3L test probe exhibits impressive electrical characteristics. It achieves a bandwidth of -0.57dB at 20GHz, enabling accurate signal transmission at high frequencies. With a current rating of 2A and contact resistance below 100mΩ, it ensures efficient power handling and minimal signal loss.
Model: CPM-GX038FR-2.87L
Materials and Finishes: The CPM-GX038FR-2.87L test probe features a Plunger-Top and Plunger-Bottom made of BeCu and coated with Au plating. The Barrel is composed of P.B. with an Au plating, while the Spring is constructed of Music Wire and also features an Au plating. These materials offer excellent conductivity and durability for reliable testing.
Mechanical Precision: With a spring force of 16 grams at 0.4mm, the CPM-GX038FR-2.87L test probe ensures precise and stable contact. The full travel distance of 0.6mm and the recommended travel distance of 0.4mm provide versatility for various testing requirements. Its mechanical life of 200K cycles guarantees long-term performance.
Impressive Bandwidth and Electrical Specifications: The CPM-GX038FR-2.87L test probe delivers excellent electrical performance, achieving a bandwidth of -0.217dB at 20GHz. This enables accurate signal transmission and measurements even at high frequencies. With a current rating of 2A and contact resistance below 100mΩ, it ensures efficient power handling and minimal signal loss.
Model: CPM-GX058FB-10.8L
Materials and Finishes: Similar to the previous model, the CPM-GX058FB-10.8L test probe features a Plunger-Top and Plunger-Bottom made of BeCu and coated with Au plating. The Barrel is composed of P.B. with an Au plating, while the Spring is constructed of Music Wire and also features an Au plating. These materials provide optimal conductivity and durability.
Mechanical Precision: With a spring force of 30 grams at 0.9mm, the CPM-GX058FB-10.8L test probe ensures reliable and stable contact during semiconductor testing. The full travel distance of 1.5mm and the recommended travel distance of 0.9mm allow for accurate measurements. Its mechanical life of 200K cycles ensures longevity and consistent performance.
Impressive Bandwidth and Electrical Specifications: The CPM-GX058FB-10.8L test probe delivers exceptional electrical performance, achieving a bandwidth of -0.154dB at 20GHz. This ensures accurate signal transmission and measurements even at high frequencies. With a current rating of 2A and contact resistance below 100mΩ, it ensures efficient power handling and minimal signal loss.